Burn In Test Probe
Package#04: Leadless Chip Carrier (H-LCC)
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1.TestProbe-Package04-LeadlessChipCarrier
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Tagged Burn in, leadless chip carrier, test probe
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1.TestProbe-Package03-DTO
Burn In Test Probe
Package #03: D-TO
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1.TestProbe-Package02-Flatpack
Burn In Test Probe
Package #02: FLATPACK (C_FP)
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Tagged Burn in, flat pack, test probe
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1.TestProbe-Package01-DualInLine
Burn In Test Probe
Package #01: DUAL IN LINE01(A_DIP)
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Tagged Burn in, dual in line, test probe
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Protected: Patent#006: Non-abrasive electrical test contact
Posted in Patent, RU
Tagged electrical, non abrasive, test contact
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Protected: Patent#005: Probe for integrated circuit test socket
Posted in Patent, RU
Tagged integrated circuit, Probe, test socket
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Protected: Patent#004: Socket contact with kelvin contact for testing integrated circuit devices
Posted in Patent, RU
Tagged integrated circuit, kelvin contact, socket contact, testing
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Protected: Patent#003: Electrical contactor for testing integrated circuit devices
Posted in Patent, RU
Tagged device, electrical contactor, integrated circuit, testing
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Protected: Patent#002: Connector contact fingers for testing integrated circuit packages
Posted in Patent, RU
Tagged connector, Contact Finger, integrated circuit package, testing
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Protected: Patent#001: Apparatus for facilitating zero-insertion of a burn-in test probe into a socket
Posted in Patent, RU
Tagged Apparatus, burn in test probe, zero insertion
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