Category Archives: Patent

Protected: Patent#006: Non-abrasive electrical test contact

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Protected: Patent#005: Probe for integrated circuit test socket

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Protected: Patent#004: Socket contact with kelvin contact for testing integrated circuit devices

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Protected: Patent#003: Electrical contactor for testing integrated circuit devices

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Protected: Patent#002: Connector contact fingers for testing integrated circuit packages

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Protected: Patent#001: Apparatus for facilitating zero-insertion of a burn-in test probe into a socket

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