Probe

Burn-in Test Probes


TP#01: DUAL IN LINE 0.1″ (DIP) [ Code A : 2 item ]
TP#02: SPECIAL FLATPACK (SO) [ Code B ]
TP#03: FLATPACK (FP) [ Code C: 6 items ]
TP#04: TO [ Code D: 2 items ]
TP#05: SPECIAL HYBRID  [ Code E ]
TP#06: IN LINE POWER TRANSISTOR (ILPT) [ Code F ]
TP#07: SINGLE IN LINE PACKAGE (SIP) [ Code G ]
TP#08: LEADLESS CHIP CARRIER (LCC) [ Code H: 12 items ]
TP#09: PLASTIC LEADLESS CHIP CARRIER (PLCC) [ Code J: 19 items ]
TP#10: SMALL OUTLINE IC (SOIC) [ Code K: 3 items ]
TP#11: SMALL OUTLINE J LEAD (SOJ) [ Code M: 7 items ]
TP#12: PIN GRID ARRAY (PGA) [ Code N: 1 items ]
TP#13: ZIG ZAG IN LINE PACKAGE (ZIP) [ Code P ]
TP#14: VERY SMALL OUTLINE PACKAGE (VSOP) [ Code Q ]
TP#15: VERY SMALL QUAD FLAT PACKAGE (VQFP) [ Code R: 3 items ]
TP#16: QUAD FLAT PACKAGE (QFP) [ Code S: 10 items ]
TP#17: CERAMIC LEADED CHIP PACKAGE (CLCC) [ Code T: 0 items ]
TP#18: TAPE AUTOMATED BONDING (TAB) [ Code U: 3 items ]
TP#19: THIN SOP (TSOP) [ Code V: 4 items ]
TP#20: VPAK [ Code W ]
TP#21: THIN QUAD FLAT PACKAGE (TQFP) [ Code X ]
TP#22: BALL GRID ARRAYS (BGA) [ Code Y: 3 items ]
TP#23: SOP [ Code Z ]
TP#24: MSOP [Code BB ]
TP#25: CS [ Code BC ]
TP#26: SPECIAL [ Code BD ]
TP#27: MLP / MLF / QFN [ Code BE]
TP#28: SSOP [ Code BF ]
TP#29: SOT / SC [ Code BG ]
TP#40: EDGE CONNECTOR [ Code BR ]

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CONTACT MATERIALS :
(a) Cannot be easily soldered
(b) Conductive within Military Standard 883C
(c) Will not oxidize so no gold platting is required
(d) Harder than beryllium copper and can withstand longer wear and tear
(e) Kelvin contact concept

PROBES PHYSICAL :
(a) Molded design for all packages
(b) Presentable
(c) Compact
(d) Easy handling
(e) Easy attachable wire
(f) No tooling charge for special packages
(g) No peeling problem

WIDER RANGE AND NO ENGINEERING :
(a) Can make probes that meets customers’ requirements
(b) No engineering charge involved even for special packages
(c) Can meet accuracy of fine pitch probes due to molding process

FLATPACKAGES :
(a) Material of stainless steel or alloy
(b) Correct simulation
(c) If probe wear out after numerous insertions, contact material can be reused

VERY SMALL QUAD :
(a) Use double contact concept
(b) Correct simulation with 5 mil extra of protruding pins so as to acheive double contact concept

LEADLESS/PLASTIC :
(a) 75% of pins are molded together with body to avoid peeling of pins 25% of pins are miled out
(b) Correct simulation act like DEVICE.

TAP PACK :
(a) Can make all types of probes for this package
(b) Can meet very tight tolerance due to molded design

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