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<channel>
	<title>TEST MAX</title>
	<atom:link href="http://testmax.com.sg/feed/" rel="self" type="application/rss+xml" />
	<link>http://testmax.com.sg</link>
	<description>(We test it to the MAX)</description>
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			<item>
		<title>New Multitest Contact Finger Ck1-441-00 added</title>
		<link>http://testmax.com.sg/2009/09/new-multitest-contact-finger-ck1-441-00-added/</link>
		<comments>http://testmax.com.sg/2009/09/new-multitest-contact-finger-ck1-441-00-added/#comments</comments>
		<pubDate>Wed, 09 Sep 2009 11:53:40 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[News]]></category>
		<category><![CDATA[Sticky]]></category>
		<category><![CDATA[ck1-441]]></category>
		<category><![CDATA[Contact Finger]]></category>
		<category><![CDATA[multitest]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=629</guid>
		<description><![CDATA[
Click on the photo above for more detail
]]></description>
			<content:encoded><![CDATA[<p style="text-align: center;"><a href="http://testmax.com.sg/2009/10/v2cf11-multitest/"><img class="size-full wp-image-627 aligncenter" title="ContactFinger_08_MULTITEST(CK)_13_CK1-441-00" src="http://testmax.com.sg/wp-content/uploads/2009/04/ContactFinger_08_MULTITESTCK_13_CK1-441-00.jpg" alt="ContactFinger_08_MULTITEST(CK)_13_CK1-441-00" width="560" height="420" /></a></p>
<p style="text-align: center;">Click on the photo above for more detail</p>
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		</item>
		<item>
		<title>New Contact Finger and Test Sockets Update</title>
		<link>http://testmax.com.sg/2009/06/new-contact-finger-and-test-sockets-update/</link>
		<comments>http://testmax.com.sg/2009/06/new-contact-finger-and-test-sockets-update/#comments</comments>
		<pubDate>Thu, 25 Jun 2009 11:13:20 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[News]]></category>
		<category><![CDATA[Sticky]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=592</guid>
		<description><![CDATA[Test Max is please to launch its new Contact Fingers and Test Sockets specially designed with the following features:
1) Small and Compact
2) Fine Pitch of 0.35mm with kelvin included .
3) Test Contact Resistance of 30mill Ohm.
4) Spacing of kelvin contact gap with min of 0.05mm.
5) Compression of contact pin can travel to 0.5mm.
(Click on the [...]]]></description>
			<content:encoded><![CDATA[<p>Test Max is please to launch its new Contact Fingers and Test Sockets specially designed with the following features:</p>
<p>1) Small and Compact<br />
2) Fine Pitch of 0.35mm with kelvin included .<br />
3) Test Contact Resistance of 30mill Ohm.<br />
4) Spacing of kelvin contact gap with min of 0.05mm.<br />
5) Compression of contact pin can travel to 0.5mm.</p>
<p>(Click on the image for detail)</p>
<p style="text-align: center;"><a href="http://testmax.com.sg/2009/10/v2cf52-testmax-design/" target="_self"><img class="aligncenter size-full wp-image-1465" title="CF52P01V23_TestMaxDesign_DZ48-56_Shrink" src="http://testmax.com.sg/wp-content/uploads/2009/06/CF52P01V23_TestMaxDesign_DZ48-56_Shrink.jpg" alt="CF52P01V23_TestMaxDesign_DZ48-56_Shrink" width="500" height="500" /></a></p>
<p style="text-align: center;">
<p style="text-align: center;">
<p style="text-align: center;">
<p style="text-align: center;">
<p style="text-align: center;">
<p style="text-align: center;">Note: Johnstech and Johnstech logos are trademarks of Johnstech International (<a href="http://www.johnstech.com/" target="_blank">http://www.johnstech.com/</a>). All rights reserved.</p>
<p style="text-align: center;">.</p>
<p style="text-align: center;">
<p style="text-align: center;"><a href="http://testmax.com.sg/2009/10/v2cf52-testmax-design/"><img class="aligncenter size-full wp-image-1367" title="CF52P02V20_TestMaxDesign_DZ3-19_Shrink" src="http://testmax.com.sg/wp-content/uploads/2009/10/CF52P02V20_TestMaxDesign_DZ3-19_Shrink.jpg" alt="CF52P02V20_TestMaxDesign_DZ3-19_Shrink" width="500" height="470" /></a></p>
<p style="text-align: center;">
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		</item>
		<item>
		<title>Patent</title>
		<link>http://testmax.com.sg/2009/04/patent/</link>
		<comments>http://testmax.com.sg/2009/04/patent/#comments</comments>
		<pubDate>Wed, 01 Apr 2009 09:28:16 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Patent]]></category>
		<category><![CDATA[testmax patents]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=554</guid>
		<description><![CDATA[The following are the links to our patent technology..
(Please note that you need to have the password to access these pages. You may request for a free password by filling out our contact form here )

Patent#001: Apparatus for facilitating zero-insertion of a burn-in test probe into a socket
Patent#002: Connector contact fingers for testing integrated circuit [...]]]></description>
			<content:encoded><![CDATA[<p>The following are the links to our patent technology..</p>
<p>(Please note that you need to have the password to access these pages. You may request for a free password by filling out our contact form <a href="http://testmax.com.sg/contact-us/" target="_blank">here </a>)</p>
<ul>
<li><a href="http://testmax.com.sg/2009/02/patent001-apparatus-for-facilitating-zero-insertion-of-a-burn-in-test-probe-into-a-socket/" target="_self">Patent#001: Apparatus for facilitating zero-insertion of a burn-in test probe into a socket</a></li>
<li><a href="http://testmax.com.sg/2009/02/patent002-connector-contact-fingers-for-testing-integrated-circuit-packages/" target="_self">Patent#002: Connector contact fingers for testing integrated circuit packages</a></li>
<li><a href="http://testmax.com.sg/2009/02/patent003-electrical-contactor-for-testing-integrated-circuit-devices/" target="_self">Patent#003: Electrical contactor for testing integrated circuit devices</a></li>
<li><a href="http://testmax.com.sg/2009/02/patent004-socket-contact-with-kelvin-contact-for-testing-integrated-circuit-devices/" target="_self">Patent#004: Socket contact with kelvin contact for testing integrated circuit devices </a></li>
<li><a href="http://testmax.com.sg/2009/02/patent005-probe-for-integrated-circuit-test-socket/" target="_self">Patent#005: Probe for integrated circuit test socket</a></li>
<li><a href="http://testmax.com.sg/2009/02/patent006-non-abrasive-electrical-test-contact/" target="_self">Patent#006: Non-abrasive electrical test contact</a></li>
</ul>
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		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>Protected: Patent#006: Non-abrasive electrical test contact</title>
		<link>http://testmax.com.sg/2009/02/patent006-non-abrasive-electrical-test-contact/</link>
		<comments>http://testmax.com.sg/2009/02/patent006-non-abrasive-electrical-test-contact/#comments</comments>
		<pubDate>Thu, 05 Feb 2009 10:40:49 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Patent]]></category>
		<category><![CDATA[electrical]]></category>
		<category><![CDATA[non abrasive]]></category>
		<category><![CDATA[test contact]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=298</guid>
		<description><![CDATA[There is no excerpt because this is a protected post.]]></description>
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<p>This post is password protected. To view it please enter your password below:</p>
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]]></content:encoded>
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		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>Protected: Patent#005: Probe for integrated circuit test socket</title>
		<link>http://testmax.com.sg/2009/02/patent005-probe-for-integrated-circuit-test-socket/</link>
		<comments>http://testmax.com.sg/2009/02/patent005-probe-for-integrated-circuit-test-socket/#comments</comments>
		<pubDate>Thu, 05 Feb 2009 10:21:13 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Patent]]></category>
		<category><![CDATA[integrated circuit]]></category>
		<category><![CDATA[Probe]]></category>
		<category><![CDATA[test socket]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=293</guid>
		<description><![CDATA[There is no excerpt because this is a protected post.]]></description>
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<p>This post is password protected. To view it please enter your password below:</p>
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]]></content:encoded>
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		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>Protected: Patent#004: Socket contact with kelvin contact for testing integrated circuit devices</title>
		<link>http://testmax.com.sg/2009/02/patent004-socket-contact-with-kelvin-contact-for-testing-integrated-circuit-devices/</link>
		<comments>http://testmax.com.sg/2009/02/patent004-socket-contact-with-kelvin-contact-for-testing-integrated-circuit-devices/#comments</comments>
		<pubDate>Thu, 05 Feb 2009 10:11:53 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Patent]]></category>
		<category><![CDATA[integrated circuit]]></category>
		<category><![CDATA[kelvin contact]]></category>
		<category><![CDATA[socket contact]]></category>
		<category><![CDATA[testing]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=289</guid>
		<description><![CDATA[There is no excerpt because this is a protected post.]]></description>
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<p>This post is password protected. To view it please enter your password below:</p>
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]]></content:encoded>
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		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>Protected: Patent#003: Electrical contactor for testing integrated circuit devices</title>
		<link>http://testmax.com.sg/2009/02/patent003-electrical-contactor-for-testing-integrated-circuit-devices/</link>
		<comments>http://testmax.com.sg/2009/02/patent003-electrical-contactor-for-testing-integrated-circuit-devices/#comments</comments>
		<pubDate>Thu, 05 Feb 2009 10:03:50 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Patent]]></category>
		<category><![CDATA[device]]></category>
		<category><![CDATA[electrical contactor]]></category>
		<category><![CDATA[integrated circuit]]></category>
		<category><![CDATA[testing]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=284</guid>
		<description><![CDATA[There is no excerpt because this is a protected post.]]></description>
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<p>This post is password protected. To view it please enter your password below:</p>
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]]></content:encoded>
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		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>Protected: Patent#002: Connector contact fingers for testing integrated circuit packages</title>
		<link>http://testmax.com.sg/2009/02/patent002-connector-contact-fingers-for-testing-integrated-circuit-packages/</link>
		<comments>http://testmax.com.sg/2009/02/patent002-connector-contact-fingers-for-testing-integrated-circuit-packages/#comments</comments>
		<pubDate>Thu, 05 Feb 2009 09:45:40 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Patent]]></category>
		<category><![CDATA[connector]]></category>
		<category><![CDATA[Contact Finger]]></category>
		<category><![CDATA[integrated circuit package]]></category>
		<category><![CDATA[testing]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=277</guid>
		<description><![CDATA[There is no excerpt because this is a protected post.]]></description>
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]]></content:encoded>
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		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>Protected: Patent#001: Apparatus for facilitating zero-insertion of a burn-in test probe into a socket</title>
		<link>http://testmax.com.sg/2009/02/patent001-apparatus-for-facilitating-zero-insertion-of-a-burn-in-test-probe-into-a-socket/</link>
		<comments>http://testmax.com.sg/2009/02/patent001-apparatus-for-facilitating-zero-insertion-of-a-burn-in-test-probe-into-a-socket/#comments</comments>
		<pubDate>Thu, 05 Feb 2009 09:29:23 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Patent]]></category>
		<category><![CDATA[Apparatus]]></category>
		<category><![CDATA[burn in test probe]]></category>
		<category><![CDATA[zero insertion]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=267</guid>
		<description><![CDATA[There is no excerpt because this is a protected post.]]></description>
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]]></content:encoded>
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		<slash:comments>1</slash:comments>
		</item>
		<item>
		<title>V2SC40: Edge Connectors</title>
		<link>http://testmax.com.sg/2009/10/v2sc40-edge-connectors/</link>
		<comments>http://testmax.com.sg/2009/10/v2sc40-edge-connectors/#comments</comments>
		<pubDate>Sat, 31 Oct 2009 09:49:42 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[3.SocketConnector]]></category>
		<category><![CDATA[connector]]></category>
		<category><![CDATA[edge connector]]></category>
		<category><![CDATA[mbr80-1]]></category>
		<category><![CDATA[socket]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=1409</guid>
		<description><![CDATA[Sockets / Connectors 
Package #40: Edge Connectors
To request for more specification, please contact us here.
.
Product Pictures (Click on photo for higher resolution).
.

]]></description>
			<content:encoded><![CDATA[<p><span style="text-decoration: underline;">Sockets / Connectors </span><br />
Package #40: Edge Connectors<br />
To request for more specification, please contact us <a href="http://testmax.com.sg/contact-us/" target="_self">here</a>.<br />
.</p>
<p><span style="text-decoration: underline;">Product Pictures (Click on photo for higher resolution)</span>.<br />
.</p>
<p style="text-align: center;"><a href="http://testmax.com.sg/wp-content/uploads/2009/10/SC40P01V20_EdgeConnectors_MBR80-1_.jpg" target="_blank"><img class="aligncenter size-full wp-image-1410" title="SC40P01V20_EdgeConnectors_MBR80-1_Shrink" src="http://testmax.com.sg/wp-content/uploads/2009/10/SC40P01V20_EdgeConnectors_MBR80-1_Shrink.jpg" alt="SC40P01V20_EdgeConnectors_MBR80-1_Shrink" width="450" height="500" /></a></p>
]]></content:encoded>
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